Quantitative characterization of very thin films: A case study of plasma-facing material for fusion reactors
Palestrante: Prof. Tiago Fiorini da Silva (IFUSP)
Data e Local: 14/05, 6ª feira, 14h. Via Google Stream. Solicite link para participação interativa por lamfi@if.usp.br.
Resumo
The accurate quantitative characterization of very thin films, having few nanometers of thickness, is challenging. Theoretically, this task can be accomplished by Rutherford Backscattering Spectrometry using heavy-ion probes. However, the conventional solid-state detectors do not offer enough energy resolution to differentiate very thin layers. One solution for that is using a time-of-flight detector. In this seminar, I will present the efforts to understand better, both accurately and quantitatively, the effect of preferential sputtering in EUROFER low-activation steel alloy. This material was proposed directly as plasma-facing material in recessed areas of future fusion reactor's design for demonstration power plant. It provides lower fuel retention and less weight, simplifying the design and reducing costs. We present experimental evidence of the correctness of simulations based on binary counter approximation (BCA) of the sputtering process at low-temperature regimes. However, at high temperatures, segregation must be taken into account.
Sobre o evento
Seminário promovido pelo grupo representante do Laboratório de Análise de Materiais por Feixes Iônicos do IFUSP (LAMFI-IFUSP).
