The scanning probe microscope from Bruker (Dimension Icon Workstation) has an automated measurement system (ScanAsyst) and offers a wide range of measurements in samples from a few mm2 to 6", such as atomic force microscopy (AFM) in contact mode or intermittent contact (tapping), scanning tunneling microscopy (STM), magnetic force microscopy (MFM), electrostatic force microscopy (EFM), among others. It is capable of scanning up to 90 μm in the sample plane, and analyze structures up to 12 μm in height.